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Dual layer detection system for crystalline solar wafers on the basis of an eddy current sensor.

This sensor is integrated into flat vacuum grippers and can detect not only one but two or more crystalline solar wafers during lifting process. Depending on the degree of automation these multiple layouts are removed either manually or automatically from the line.


• Eddy current measurement principle

• Sensor size M12x1 (WF12IG453S)

• For mounting in "Schmalz Wafer Gripper SWG" (WF14x15AQ453S)

• Very fast response time - less than 20 ms

• Analog output for connection to PLC

More in this category: I10 KV